The limited depth of field of microscope objectives is a known and common challenge in digital microscopy. The depth of field varies with the numerical aperture and magnification of the objective and decreases from 8.5 micron for objectives 10X / 0.25 to 0.19 micron for objectives 100X / 0.95. In Inspection Microscopy, Geology and Mineralogy, this limitation is important and bypassing it is challenging.

Al.eF Photonics offers turn-key, customized solutions to digitally enhance partly focused microscopic images. The final result of the process is an entirely focused image and its related 3D model.